Customer orientation and affinity with the development of functionality to be implemented in software based solutions.Established experience in lithography, design and/or refinement of measurement systems and/or experimental setups in optical metrology or spectroscopy.Minimum 2 years of experience in a relevant work environment within the industry /domain.Drive Functional design and implementation in a multidisciplinary agile development team.This includes the analysis of issues which are related to the nature and processing of customer wafers that require analysis at customer site. Data analysis and performance analysis.This with an overview of the entire value chain towards the customer.Generate and maintain scripts and tools for measurement performance analysis within machine population and between platform versions.Predict, assess and drive overlay measurement performance including test methodology. ![]() Drive investigations to verify and validate the overlay system budgets of current and future Yieldstar Platforms. ![]() You will drive detailed designs for proposed solutions within a team context and prepare for testing and roll-out of this functionality after implementation. Are you a person who can think and act at system level to ensure continuous improvements in the performance of our Yieldstar machine?Īre you a person who can think and act at system level to ensure continuous improvements in the performance of our Yieldstar machine? Would you like to work in a multidisciplinary team whilst providing innovative semiconductor metrology solutions to our customer’s challenges? If so, then please read on for this job opportunity!Īs a D&E Metrology Engineer Overlay Measuring Integration Yieldstar you will drive investigations to verify and validate the overlay system budgets of current and future Yieldstar Platforms.Īnother part of the job will be to define and specify requirements of new functional modules in the Yieldstar and the associated computing platform(s).
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